VLSI - Self Built-In Test MCQs : This section focuses on the "VLSI - Self Built-In Test". These Multiple Choice Questions (MCQs) should be practiced to improve the VLSI - Self Built-In Test skills required for various interviews (campus interview, walk-in interview, company interview), placement, entrance exam and other competitive examinations.
Question 1
BILBO uses only the signature analysis.
A. TRUE
B. FALSE
Question 2
Built-in self test aims to
A. reduce test pattern generation cost
B. reduce volume of test data
C. reduce test time
D. all of the mentioned
Question 3
In data compression technique, comparison is done on
A. test response
B. entire test data
C. data inputs
D. output sequences
Question 4
In which mode, storage elements are used independently?
A. normal mode
B. test 1 mode
C. test 2 mode
D. final mode
Question 5
Self-checking technique consists of
A. supplying coded input data
B. receiving coded output data
C. supplying all possible input sequence
D. all of the mentioned
Question 6
Signature analysis performs
A. addition
B. multiplication
C. polynomial division
D. amplifies
Question 7
Storage elements are connected as a serial shift register when
A. B1=B2=1
B. B1=B2=0
C. B1=0, B2=1
D. B1=1, B2=0
Question 8
The BILBO is reset, when
A. B1=B2=1
B. B1=B2=0
C. B1=0, B2=1
D. B1=1, B2=0
Question 9
The circuit is configured as LFSR, when
A. B1=B2=1
B. B1=B2=0
C. B1=0, B2=1
D. B1=1, B2=0
Question 10
The parity check detection is done using
A. OR gate
B. AND gate
C. XOR gate
D. NOR gate
Question 11
The type of error in self-checking technique are
A. simple error
B. unidirectional error
C. multiple error
D. all of the mentioned
Question 12
Transition counting does the count of transition only in one specific direction at a time.
A. TRUE
B. FALSE
Question 13
Which errors are detected using duplication codes?
A. single errors
B. unidirectional errors
C. bidirectional errors
D. multiple errors