X-Ray Diffractometers MCQs : This section focuses on the "X-Ray Diffractometers". These Multiple Choice Questions (MCQs) should be practiced to improve the X-Ray Diffractometers skills required for various interviews (campus interview, walk-in interview, company interview), placement, entrance exam and other competitive examinations.
Question 1
Diffractometers are similar to which of the following?
A. Optical grating spectrometer
B. Prism spectrometer
C. Photo multiplier
D. Photovoltaic cell
Question 2
In Diffractometer, the identification of a component of the sample from its powder diffraction pattern is based upon the _________ of lines and their relative ___________
A. Number, length
B. Number, intensity
C. Position, length
D. Position, intensity
Question 3
In Diffractometers, line intensities depend on ______ and kind of atomic reflection centres in each set of plates.
A. Number
B. Position
C. Length
D. Distance between lines
Question 4
In Diffractometers, the intensities of the diffraction peaks of a given compound in a mixture are proportional to the fraction of the material in the mixture.
A. True
B. False
Question 5
In powder diffractometer, the sharpness of the lines is greatly determined by which of the following?
A. Quality of the sample, size of the slit
B. Quality of the slit, size of the sample
C. Thickness of the slit, amount of the sample
D. Number of slits, composition of the sample
Question 6
Using the powder method of diffractometers, which of the following can be determined?
A. Percentage of K+
B. Percentage of Na+ and Cl-
C. Percentage of KBr and NaCl
D. Percentage of Br-
Question 7
When certain geometric requirements are met, X-rays scattered from a crystalline solid can constructively interfere with each other and produce a diffracted beam.
A. TRUE
B. FALSE
Question 8
Which of the following is the most common instrument for photographic recording of diffraction patterns?
A. Debye-Scherrer powder camera
B. Gamma camera
C. Geiger tube
D. Scintillation counter
Question 9
With the help of which of the following equations is the distance calculated from a known wavelength of the source and measured angle?
A. Coolidge equation
B. Braggs equation
C. Debye equation
D. Scherrer equation
Question 10
X-ray diffractometers are not used to identify the physical properties of which of the following?
A. Metals
B. Liquids
C. Polymeric materials
D. Solids
Question 11
X-ray diffractometers provide ____________ information about the compounds present in a solid sample.
A. Quantitative
B. Qualitative
C. Quantitative and qualitative
D. Either quantitative or qualitative